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  2N5551CSM document number 6528 issue 2 semelab plc. telephone +44(0)1455 556565. fax +44(0)1455 552612. e-mail: sales@semelab.co.uk website: http://www.semelab.co.uk semelab plc reserves the right to change test conditions, parameter limits and package dimensions without notice. information f urnished by semelab is believed to be both accurate and reliable at the time of going to press. however semelab assumes no responsibility for any errors or omi ssions discovered in its use. semelab encourages customers to verify that datasheets are current before placing orders. high voltage npn switching transistor in a hermetically sealed ceramic surface mount package for high reliability applications features ? silicon planar epitaxial npn transistor ? hermetic ceramic surface mount package (sot23 compatible) ? cecc screening options applications: hermetically sealed surface mount 2n5551 for high reliability / space applications requiring small size and low weight devices. v cbo collector ? base voltage v ceo collector ? emitter voltage v ebo emitter ? base voltage i c collector current p d total device dissipation @ t a =25c derate >25 c t stg , t j operating and storage temperature range 180v 160v 6v 600ma 350mw 0.2c/mw ?55 to +150c mechanical data dimensions in mm (inches) sot23 ceramic (lcc1 package) absolute maximum ratings (t a = 25c unless otherwise stated) pad 1 ? base underside view pad 2 ? emitter pad 3 ? collector 21 0.51 0.10 (0.02 0.004) 0.31 (0.012) 1.91 0.10 (0.075 0.004) 3.05 0.13 (0.12 0.005) 2.54 0.13 (0.10 0.005) 0.76 0.15 (0.03 0.006) 1.02 0.10 (0.04 0.004) 1.40 (0.055) max. a 0.31 (0.012) rad. rad. a = 3
2N5551CSM document number 6528 issue 2 semelab plc. telephone +44(0)1455 556565. fax +44(0)1455 552612. e-mail: sales@semelab.co.uk website: http://www.semelab.co.uk semelab plc reserves the right to change test conditions, parameter limits and package dimensions without notice. information f urnished by semelab is believed to be both accurate and reliable at the time of going to press. however semelab assumes no responsibility for any errors or omi ssions discovered in its use. semelab encourages customers to verify that datasheets are current before placing orders. parameter test conditions min. typ. max. unit i c = 1.0ma i b = 0ma i c = 100 ai e = 0ma i e = 10 ai c = 0ma v cb = 120v i e = 0 t a = +100c v eb = 4v i c = 0 i c = 10ma i b = 1.0ma i c = 50ma i b = 5ma i c = 10ma i b = 1.0ma i c = 50ma i b = 5ma i c = 1.0ma v ce = 5v i c = 10ma v ce = 5v i c = 50ma v ce = 5v i c = 10ma v ce = 10v f = 100mhz v cb = 10v i e = 0 f = 1.0 mhz v eb = 0.5v i c = 0 f = 1.0 mhz i c = 250 av ce = 5v r s =1.0 k f = 1.0 khz v ce = 10v i c =1.0 ma f = 1.0 khz electrical characteristics (t a = 25c unless otherwise stated) v (br)ceo* collector ? emitter breakdown voltage v (br)cbo collector ? base breakdown voltage v (br)ebo emitter ? base breakdown voltage i cbo collector ? base cut-off current i ebo emitter ? base cut-off current v ce(sat) collector ? emitter saturation voltage v be(sat) base ? emitter saturation voltage h fe* current gain f t current gain bandwidth product c obo output capacitance c ib input capacitance nf noise figure h fe* current gain 160 180 6 50 50 50 0.15 0.20 1.0 1.0 80 80 250 30 100 300 6 60 8 50 200 v v v na a na v v ? ? pf db ? * pulse test: t p 300 s, ? 2%.


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